Etching & Ion Implantation

Plasma Etching

RIE, ICP, etch chemistry, and profile control

Plasma Etch Mechanisms

Plasma Etch Mechanisms

Plasma etching combines chemical and physical mechanisms:

  • Chemical etching: Reactive species from the plasma (F, Cl, Br radicals) react with the surface to form volatile products that pump away. High selectivity but isotropic.
  • Ion bombardment: Energetic ions (Ar+, CF₃+) physically knock atoms off the surface. Anisotropic (directional) but poor selectivity.
  • Ion-enhanced etching: The combination — ions damage the surface, making it more reactive to chemical species. This gives both anisotropy AND good selectivity.

Key plasma etch configurations:

  • RIE (Reactive Ion Etching): Capacitively coupled plasma (CCP). Lower density, good for dielectric etch.
  • ICP (Inductively Coupled Plasma): Higher plasma density, independent control of ion energy and density. Preferred for high-aspect-ratio features.

Etch Chemistry by Material

Etch Chemistry by Material

Different materials require different etch chemistries:

MaterialEtch GasesVolatile Product
SiliconSF₆, Cl₂, HBrSiF₄, SiCl₄, SiBr₄
SiO₂CF₄, C₄F₈, CHF₃SiF₄, CO, CO₂
Si₃N₄CF₄/O₂, CHF₃SiF₄, N₂
TungstenSF₆, CF₄WF₆
PhotoresistO₂CO₂, H₂O

Key Concept: Sidewall Passivation

To achieve vertical sidewalls, fluorocarbon gases (C₄F₈) deposit a thin polymer on sidewalls during etching. Ion bombardment removes this polymer from the bottom but not the sidewalls, so etching proceeds only downward. This passivation mechanism is key to anisotropic etching.

Knowledge Check

Knowledge Check

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What type of plasma source provides independent control of ion energy and density?